
Kelvin Probe Force Microscopy
2 429,-

Kinetics of Evaporation
1 709,-

Optical Characterization of Thin Solid Films
1 826,-

Confocal Raman Microscopy
3 014,-

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
3 014,-

Ellipsometry of Functional Organic Surfaces and Films
1 214,-

Spin-Polarized Two-Electron Spectroscopy of Surfaces
1 124,-

Surface Plasmon Resonance Sensors
1 214,-

Photoelectron Spectroscopy
1 466,-

The Physics of Thin Film Optical Spectra
1 826,-

Kelvin Probe Force Microscopy
2 429,-

Kinetics of Evaporation
1 709,-

Optical Characterization of Thin Solid Films
1 826,-

Confocal Raman Microscopy
3 014,-

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
3 014,-

Ellipsometry of Functional Organic Surfaces and Films
1 214,-

Spin-Polarized Two-Electron Spectroscopy of Surfaces
1 124,-

Surface Plasmon Resonance Sensors
1 214,-

Photoelectron Spectroscopy
1 466,-

The Physics of Thin Film Optical Spectra
1 826,-