Pensum -10%Applications of Finite Element Methods for Reliability Studies on ULSI InterconnectionsCher Ming Tan, Zhenghao Gan og 2 andreInnbundetEngelskDel av serien Springer Series in Reliability EngineeringLegg i handlekurvUtsolgt
Graphene and VLSI InterconnectsCher-Ming Tan, Vivek Sangwan og 1 annenInnbundetEngelskLegg i handlekurvUtsolgt
Pensum -10%Electromigration Modeling at Circuit Layout LevelCher Ming Tan, Feifei HePocketEngelskDel av serien SpringerBriefs in Applied Sciences and TechnologyLegg i handlekurvUtsolgt
Pensum -10%ELECTROMIGRATION IN ULSI INTERCONNECTIONSCher Ming TanInnbundetEngelskDel av serien International Series On Advances In Solid State Electronics And TechnologyLegg i handlekurvUtsolgt
