Applications of Finite Element Methods for Reliability Studies on ULSI InterconnectionsCher Ming Tan, Zhenghao Gan og 2 andreInnbundetEngelskDel av serien Springer Series in Reliability EngineeringLegg i handlekurvNettlager
Graphene and VLSI InterconnectsCher-Ming Tan, Vivek Sangwan og 1 annenInnbundetEngelskLegg i handlekurvNettlager
Electromigration Modeling at Circuit Layout LevelCher Ming Tan, Feifei HePocketEngelskDel av serien SpringerBriefs in Applied Sciences and TechnologyLegg i handlekurvNettlager
Electromigration In Ulsi InterconnectionsCher Ming TanInnbundetEngelskDel av serien International Series On Advances In Solid State Electronics And TechnologyLegg i handlekurvNettlager
