Optical Phenomena in Semiconductor Structures of Reduced Dimensions
Aron Pinczuk, David J. Lockwood
InnbundetEngelsk
Del av serien NATO Science Series E:
Hopp til hovedinnholdet
Electron and Ion Microscopy and Microanalysis
Redigert av Lawrence E Murr, 2019.
Principles and Applications, Second Edition,
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Språk: Engelsk
949,-
Ikke tilgjengelig for Klikk&Hent
Midlertidig tomt på lager
Bestillingsvare. Forventes sendt om ca 9 dager
Oppdag mer
Electron and Ion Microscopy and Microanalysis
Redigert av Lawrence E Murr, 2019.
Principles and Applications, Second Edition,
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Oppdag mer
949,-
Språk: Engelsk
Ikke tilgjengelig for Klikk&Hent
Midlertidig tomt på lager
Bestillingsvare. Forventes sendt om ca 9 dager
949,-
Ved å fullføre kjøpet aksepterer du kjøpsvilkårene.
