
Ion Beam Modification of Solids
2 429,-

Ellipsometry of Functional Organic Surfaces and Films
1 214,-

Exoemission from Processed Solid Surfaces and Gas Adsorption
1 952,-

Surface Plasmon Resonance Sensors
1 214,-

Kinetics of Evaporation
1 709,-

Optical Characterization of Thin Solid Films
1 826,-

Confocal Raman Microscopy
3 014,-

Kelvin Probe Force Microscopy
2 429,-

Optical Characterization of Thin Solid Films
1 826,-

Spin-Polarized Two-Electron Spectroscopy of Surfaces
1 124,-

Ion Beam Modification of Solids
2 429,-

Ellipsometry of Functional Organic Surfaces and Films
1 214,-

Exoemission from Processed Solid Surfaces and Gas Adsorption
1 952,-

Surface Plasmon Resonance Sensors
1 214,-

Kinetics of Evaporation
1 709,-

Optical Characterization of Thin Solid Films
1 826,-

Confocal Raman Microscopy
3 014,-

Kelvin Probe Force Microscopy
2 429,-

Optical Characterization of Thin Solid Films
1 826,-

Spin-Polarized Two-Electron Spectroscopy of Surfaces
1 124,-