

High-Performance Carbon-Based Optoelectronic Nanodevices
1 826,-

Units of Measurement
1 952,-

Extended Defects in Germanium
1 592,-

Mass Metrology
1 709,-

Atom Probe Microscopy
2 996,-

High-Performance Carbon-Based Optoelectronic Nanodevices
1 826,-

Biomimetics in Materials Science
1 592,-

Metal-Dielectric Interfaces in Gigascale Electronics
1 124,-

Effective Electron Mass in Low-Dimensional Semiconductors
1 592,-

Metal Impurities in Silicon- and Germanium-Based Technologies
1 826,-

High-Performance Carbon-Based Optoelectronic Nanodevices
1 826,-

Units of Measurement
1 952,-

Extended Defects in Germanium
1 592,-

Mass Metrology
1 709,-

Atom Probe Microscopy
2 996,-

High-Performance Carbon-Based Optoelectronic Nanodevices
1 826,-

Biomimetics in Materials Science
1 592,-

Metal-Dielectric Interfaces in Gigascale Electronics
1 124,-

Effective Electron Mass in Low-Dimensional Semiconductors
1 592,-

Metal Impurities in Silicon- and Germanium-Based Technologies
1 826,-















