Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Redigert av Krishnendu Chakrabarty, Sandeep K. Goel, 2017.Del av serien Devices, Circuits, and Systems.
Advances in design methods and process technologies are leading to a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause timing failures on both critical and non-critical paths in the circuit.
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Redigert av Krishnendu Chakrabarty, Sandeep K. Goel, 2017.Del av serien Devices, Circuits, and Systems.
Advances in design methods and process technologies are leading to a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause timing failures on both critical and non-critical paths in the circuit.
Oppdag mer
Ikke tilgjengelig for Klikk&Hent
Midlertidig tomt på lager
Bestillingsvare. Forventes sendt om ca 10 dager
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