













Advanced Concepts and Architectures for Plasma-Enabled Material Processing
584,-

New Prospects of Integrating Low Substrate Temperatures with Scaling-Sustained Device Architectural Innovation
323,-

Sustaining Moore''s Law
359,-

Compound Semiconductor Materials and Devices
323,-

Resistive Random Access Memory (RRAM)
323,-

Layout Techniques in MOSFETs
323,-

Radiation Imaging Detectors Using SOI Technology
323,-

Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET
359,-

Advances in Reflectometric Sensing for Industrial Applications
359,-

Superconducting Memory Technologies
431,-

Advanced Concepts and Architectures for Plasma-Enabled Material Processing
584,-

New Prospects of Integrating Low Substrate Temperatures with Scaling-Sustained Device Architectural Innovation
323,-

Sustaining Moore''s Law
359,-

Compound Semiconductor Materials and Devices
323,-

Resistive Random Access Memory (RRAM)
323,-

Layout Techniques in MOSFETs
323,-

Radiation Imaging Detectors Using SOI Technology
323,-

Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET
359,-

Advances in Reflectometric Sensing for Industrial Applications
359,-

Superconducting Memory Technologies
431,-